可售专利库 MVC专利
上海硅知识产权交易中心有限公司(SSIPEX)是工业和信息化部、上海市为促进我国集成电路设计业成长,提升电子信息产业知识产权水平,培育物联网等新兴产业发展而建立的行业性公共服务机构之一。
| 联系人 / Contact
张军
| 联系电话 / Tel
86-21-61154610 - 8822
专利名称Patent Title
一种基于Contourlet变换的质降参考图像质量评价方法
Method for evaluating quality-lose referrence image quality base on Contourlet transformation
点评:一种基于Contourlet变换的质降参考图像质量评价方法,该方法利用Contourlet变换对图像的方向信息进行捕捉,有效地提取反映参考图像和测试图像的纹理结构信息的图像Contourlet变换域子带的变换系数矩阵的均值和标准差作为图像的统计特征值,通过比较参考图像和测试图像之间纹理结构信息的相似度,最终获得测试图像的质量分值,利用图像之间纹理结构信息的相似度进行图像质量评价可以不要求参考图像具有相当好的视觉质量,图像质量评价结果只单纯地反映参考图像与测试图像之间的相似度,即评价结果可以客观地反映图像处理或压缩算法对图像质量变化的影响。

Comment: The invention discloses a degraded reference image quality evaluation method based on Contourlet transformation. The method utilizes Contourlet transformation to catch the direction information of an image, effectively extracts the average value and the standard deviation of a transform coefficient matrix of an image Contourlet transformation domain sub-band reflecting the texture structure information of a reference image and a tested image as statistical attribute values of the image; by comparing the similarity of the texture structure information between the reference image and the testedimage, the quality value of the tested image is finally obtained; image quality evaluation carried out by utilizing the similarity of the texture structure information between images does not requirethe reference image of very good visual quality, and the result of image quality evaluation purely reflects the similarity between the reference image and the tested image, namely, the result of evaluation can objectively reflects the influences of image processing or compression algorithm on the change of image quality.
地址:上海市徐汇区宜山路333号汇鑫大厦1号楼1704室   邮编:200030
ADD:Rm1704,HUIXIN Building,333yishan Rd,Shanghai,P.R.China, 200030
TEL:86-21-61154610    86-21-61154686
FAX:86-21-61154601